For most VNA applications, especially when test results are collected manually by an operator, measurement speeds on the order of 15 microseconds per point are more than adequate. However, in certain applications including semiconductor production, such measurement speeds can contribute significantly to test time being a bottleneck in the overall manufacturing process.

Copper Mountain Technologies USB VNAs provide a low-cost semiconductor testing option, offering measurement speeds on the order of 10,000 points per second while maintaining 80-90 dB dynamic range, are uniquely suited for deployment into such demanding scenarios. Additional considerations for these applications include availability of external trigger inputs and outputs, amenability to external program control, size of the instrument, and parallel processing capability.